Electronic Resource

Test Generation of Crosstalk Delay Faults in VLSI Circuits

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Penilaian

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This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

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Availability

Inventory Code	Barcode	Call Number	Location	Status
1908001959	EB0002620	621.395 Jay	Central Library (OPAC)	Available

Detail Information

Series Title

-

Call Number

621.395 Jay

Publisher

Singapore : Springer Singapore., 2018

Collation

XI, 156p.:ll

Language

English

ISBN/ISSN

978-981-13-2493-2

Classification

621.395

Content Type

Ebook

Media Type

-

Carrier Type

online resource

Edition

1

Subject(s)

Crosstalk

Specific Detail Info

-

Statement of Responsibility

BRF

Other version/related

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