Test Generation of Crosstalk Delay Faults in VLSI Circuits
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both determinis…
- Edition
- 1
- ISBN/ISSN
- 978-981-13-2493-2
- Collation
- XI, 156p.:ll
- Series Title
- -
- Call Number
- 621.395 Jay
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