Multi-run Memory Tests for Pattern Sensitive Faults
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author …
- Edition
- 1
- ISBN/ISSN
- 978-3-319-91204-2
- Collation
- Switzerland
- Series Title
- x, 135p.:Ill
- Call Number
- 621.381 52 Mro m
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Found 1 from your keywords: Author : Mrozek, Ireneusz
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