Bias Temperature Instability for Devices and Circuits
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefi…
- Edition
- -
- ISBN/ISSN
- 978-1-4614-7909-3
- Collation
- xi,810p.: III.
- Series Title
- -
- Call Number
- 537.6221 Bia
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