APA Style
Jayanthy, S., Bhuvaneswari, M.C.. (2018).
Test Generation of Crosstalk Delay Faults in VLSI Circuits (1).
Singapore:
Springer Singapore.
Chicago Style
Jayanthy, S., Bhuvaneswari, M.C..
Test Generation of Crosstalk Delay Faults in VLSI Circuits.
1
Singapore:
Springer Singapore,
2018.
Electronic Resource.
MLA Style
Jayanthy, S., Bhuvaneswari, M.C..
Test Generation of Crosstalk Delay Faults in VLSI Circuits.
1
Singapore:
Springer Singapore,
2018.
Electronic Resource.
Turabian Style
Jayanthy, S., Bhuvaneswari, M.C..
Test Generation of Crosstalk Delay Faults in VLSI Circuits.
1
Singapore:
Springer Singapore,
2018.
Electronic Resource.