APA Style
Mrozek, Ireneusz. (2018).
Multi-run Memory Tests for Pattern Sensitive Faults (1).
Switzerland:
Springer Cham.
Chicago Style
Mrozek, Ireneusz.
Multi-run Memory Tests for Pattern Sensitive Faults.
1
Switzerland:
Springer Cham,
2018.
Electronic Resource.
MLA Style
Mrozek, Ireneusz.
Multi-run Memory Tests for Pattern Sensitive Faults.
1
Switzerland:
Springer Cham,
2018.
Electronic Resource.
Turabian Style
Mrozek, Ireneusz.
Multi-run Memory Tests for Pattern Sensitive Faults.
1
Switzerland:
Springer Cham,
2018.
Electronic Resource.