APA Style
Zimpeck, Alexandra, Meinhardt,Cristina, Artola,Laurent, Reis, Ricardo. (2021).
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs (1).
Switzerland:
Springer Cham.
Chicago Style
Zimpeck, Alexandra, Meinhardt,Cristina, Artola,Laurent, Reis, Ricardo.
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs.
1
Switzerland:
Springer Cham,
2021.
Electronic Resource.
MLA Style
Zimpeck, Alexandra, Meinhardt,Cristina, Artola,Laurent, Reis, Ricardo.
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs.
1
Switzerland:
Springer Cham,
2021.
Electronic Resource.
Turabian Style
Zimpeck, Alexandra, Meinhardt,Cristina, Artola,Laurent, Reis, Ricardo.
Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs.
1
Switzerland:
Springer Cham,
2021.
Electronic Resource.