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Image of Soft Error Reliability of VLSI Circuits

Electronic Resource

Soft Error Reliability of VLSI Circuits

Ghavami, Behnam - Personal Name; Raji, Mohsen - Personal Name;

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This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.


Availability
Inventory Code Barcode Call Number Location Status
1908000390EB0000864621.381 5 Gha sCentral Library (OPAC)Available
Detail Information
Series Title
-
Call Number
621.381 5 Gha s
Publisher
Switzerland : Springer Cham., 2020
Collation
xiii, 114p.:Ill
Language
English
ISBN/ISSN
978-3-030-51610-9
Classification
621.381 5
Content Type
Ebook
Media Type
-
Carrier Type
online resource
Edition
-
Subject(s)
Microelectronics
Specific Detail Info
-
Statement of Responsibility
BRF
Other version/related

No other version available

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  • Soft Error Reliability of VLSI Circuits
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