Electronic Resource

Bias Temperature Instability for Devices and Circuits

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Penilaian

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This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

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Availability

Inventory Code	Barcode	Call Number	Location	Status
1408000234	EB0000394	537.6221 Bia	Central Library	Available

Detail Information

Series Title

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Call Number

537.6221 Bia

Publisher

New York : Springer New York, NY., 2014

Collation

xi,810p.: III.

Language

English

ISBN/ISSN

978-1-4614-7909-3

Classification

537.6221

Content Type

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Media Type

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Carrier Type

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Edition

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Subject(s)

Electrical Engineering
Semiconductors

Specific Detail Info

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Statement of Responsibility

RIZAL

Other version/related

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