Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm tech…
- Edition
- 1
- ISBN/ISSN
- 978-3-030-68368-9
- Collation
- XIII, 131p.:Ill
- Series Title
- -
- Call Number
- 621.381 528 4 Mit
Search Result
Found 1 from your keywords: Author : "Reis, Ricardo"
Query took 0.00104 second(s) to complete
Computer Science, Information & General Works 
Philosophy & Psychology 
Religion 
Social Sciences 
Language 
Pure Science 
Applied Sciences 
Art & Recreation 
Literature 
History & Geography