Design for Testability, Debug and Reliability
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications…
- Edition
- 1
- ISBN/ISSN
- 978-3-030-69209-4
- Collation
- XXI, 164p.:Ill
- Series Title
- -
- Call Number
- 621.381 5 Huh d
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